GaN quantum dots: nanophotonics and nanophononics
Self-assembled GaN quantum dots are characterized using Raman techniques. The electrical and optical properties of these GaN quantum dots are modeled in light of optoelectronic applications. Strain-...
Colloidal quantum dots as optoelectronic elements
A variety of colloidal semiconductor quantum dots and related quantum-wire structures are characterized using absorption and photoluminescence measurements. The electronic properties of these structu...
Fabrication of GaN nanotubular material using MOCVD with aluminum oxide membrane
Proc. SPIE, Vol. 6127, 61270K (2006);
doi:10.1117/12.640337
Online Publication Date: 28 February 2006
Conference Date: Monday 23 January 2006
Conference Location: San Jose, CA, USA
Conference Title: Quantum Sensing and Nanophotonic Devices III
Conference Chairs: Manijeh Razeghi, Gail J. Brown
GaNnanotubular material is fabricated with aluminum oxide membrane in MOCVD.SEM, XRD, TEM and PL are employed to characterize thefabricated GaN nanotubular material. An aluminum oxide membrane with orderednano holes is used as template. Gallium nitride is depositedat the inner wall of the nano holes in aluminumoxide template, and the nanotubular material with high aspect ratiois synthesized using the precursors of TMG and ammonia gas.Optimal synthesis condition in MOCVD is obtained successfully for thegallium nitride nanotubular material in this research. The diameter ofGaN nanotube fabricated is approximately 200 ~ 250 nm andthe wall thickness is about 40 ~ 50 nm. GaNnanotubular material consists of numerous fine GaN particulates with sizesranging 15 to 30 nm. The composition of gallium nitrideis confirmed to be stoichiometrically 1:1 for Ga and Nby EDS. XRD and TEM analyses indicate that grains inGaN nanotubular material have nano-crystalline structure. No blue shift isfound in the PL spectrum on the GaN nanotubular materialfabricated in aluminum oxide template.