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Adaptive infrared target detection
Automatic Target Recognition (ATR) algorithms are extremely sensitive to differences between the operating conditions under which they are trained and the extended operating conditions (EOCs) in which...
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Using image local response for efficient image fusion with the hybrid evolutionary algorithm
Image fusion serves as the basis for automatic target recognition; it maps images of teh same scene received from different sensors into a common reference system. A novel fusion method is described ...

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Unsupervised optimization of support vector machine parameters

Proc. SPIE, Vol. 5426, 316 (2004); doi:10.1117/12.542422

Online Publication Date: 20 October 2004

Conference Date: Tuesday 13 April 2004
Conference Location: Orlando, FL, USA
Conference Title: Automatic Target Recognition XIV
Conference Chairs: Firooz A. Sadjadi
Mary L. Cassabaum and Donald E. Waagen
Raytheon Missile Systems Co. (USA)

Jeffrey J. Rodriguez
Univ. of Arizona (USA)

Harry A. Schmitt
Raytheon Missile Systems Co. (USA)
Selection of the kernel parameters is critical to the performance of Support Vector Machines (SVMs), directly impacting the generalization and classification efficacy of the SVM. An automated procedure for parameter selection is clearly desirable given the intractable problem of exhaustive search methods. The authors' previous work in this area involved analyzing the SVM training data margin distributions for a Gaussian kernel in order to guide the kernel parameter selection process. The approach entailed several iterations of training the SVM in order to minimize the number of support vectors. Our continued investigation of unsupervised kernel parameter selection has led to a scheme employing selection of the parameters before training occurs. Statistical methods are applied to the Gram matrix to determine kernel optimization in an unsupervised fashion. This preprocessing framework removes the requirement for iterative SVM training. Empirical results will be presented for the "toy" checkerboard and quadboard problems.

©2004 COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
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