IR ellipsometric studies of Ti and Mo surfaces modified by high-dose ion irradiation
The effects of high-dose metal ion implantation on optical properties of metal mirrors have been analyzed by means of the IR Fourier transform spectral ellipsometry in the wavelength range 2 - 25 micr...
Effect of irradiation on quantum-size layer properties grown on semi-insulating GaAs
The effect of electron (E = 1.8 MeV), -(60Co) and X-ray irradiation on the structural and optical properties of a (Ga,Al)As and a (Zn,Cd)Te quantum wells (QWs) grown on semi-insulating (SI) GaAs is st...
Electromagnetic wave reflection by rough fractal surface of semiconductor materials
Proc. SPIE, Vol. 5024, 90 (2003);
doi:10.1117/12.497262
Online Publication Date: 18 September 2003
Conference Title: Selected Papers on Optics and Photonics: Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics
Conference Chairs: Sergey V. Svechnikov, Mikhail Y. Valakh
Inthe given work the rough surface of semiconductor is modelingby 2D fractal Wierstrass function. On the basis of theKirchhoff scalar theory the scattering indicatrices for the some typesod scattering surfaces are present. On the basis of numericalaccounts average scattering coefficient the diagrams of dependence for variousfractal semiconductor surfaces was constructed.
By Year
You are not logged in to this journal. 
Connotea
CiteULike
del.icio.us
BibSonomy
