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Optical, mechanical and thermal properties of MgF2-ZnS and MgF2-Ta2O5 composite thin films deposited by coevaporation
We deposit composite MgF2-ZnS and MgF2-Ta2O5 thin films by coevaporation, and explore their optical, mechanical and thermal properties. The refractive indices of pure MgF2, Ta2O5 and ZnS films are 1.3...
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Properties of digital holography based on in-line configuration

Opt. Eng., Vol. 39, 3214 (2000); doi:10.1117/1.1327503

Lei Xu, Jianmin Miao, and Anand Asundi
Micro Machines Laboratory, School of Mechanical and Production Engineering, Nanyang Technological University, Singapore, 639798
Digital holography for micromeasurement is an active research topic. With respect to the requirement of realizing characterization of micro-scale structures in microelectromechanical systems with high resolution and accuracy, in-line configuration is studied in this paper as the fundamental structure of a digital holography system. A mathematical model based on Fourier optics is developed to analyze the digital recording mechanism and properties of the system in comparison with those of the commonly used off-axis arrangement. Theoretical analysis and experimental results demonstrate that in-line configuration is advantageous in enhancing the system performance. Besides the relaxed requirement of spatial resolution on the CCD sensors and the greater flexibility of the system, higher lateral resolution and lower speckle noise can be achieved.

©2000 Society of Photo-Optical Instrumentation Engineers.
History: Received Dec. 13, 1999; revised July 19, 2000; accepted July 21, 2000
DOI Link: http://dx.doi.org/10.1117/1.1327503
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KEYWORDS and PACS

Keywords
PACS
  • 07.60.Ly
    Instruments, apparatus, components, and techniques common to several branches of physics and astronomy Optical instruments, equipment, and techniques Interferometers
  • 42.40.Kw
    Optics Holography Holographic interferometry; other holographic techniques
  • 42.30.Ms
    Optics Imaging and optical processing Speckle and moire patterns
  • 07.10.Cm
    Instruments, apparatus, components, and techniques common to several branches of physics and astronomy Mechanical instruments, equipment, and techniques Micromechanical devices and systems
  • 06.20.Dk
    Metrology, measurements, and laboratory procedures Metrology Measurement and error theory
  • YEAR: 2000

JOURNAL DATA

ISSN:
0091-3286 (print)   1560-2303 (online)
Publisher:
AIP is a member of CrossRef SPIE

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